Spectroscopic measurement of absorptive thin films by spectral-domain optical coherence tomography.
نویسندگان
چکیده
A non-invasive method for measuring the refractive index, extinction coefficient and film thickness of absorptive thin films using spectral-domain optical coherent tomography is proposed, analyzed and experimentally demonstrated. Such an optical system employing a normal-incident beam of light exhibits a high spatial resolution. There are no mechanical moving parts involved for the measurement except the transversal scanning module for the measurement at various transversal locations. The method was experimentally demonstrated on two absorptive thin-film samples coated on transparent glass substrates. The refractive index and extinction coefficient spectra from 510 to 580 nm wavelength range and film thickness were simultaneously measured. The results are presented and discussed.
منابع مشابه
بررسی پایایی و تکرار پذیری دستگاه Spectral domain optical coherence tomography در اندازه گیری ضخامت ماکولا در چشمهای طبیعی قبل و بعد از گشاد کردن مردمک
Background: optical coherence tomography is one of the most valuable imaging techniques in the evaluation of macula. Objective: to investigate the repeatability and reproducibility of OCT in measuring the macular thickness in normal eyes before and after pupil dilation. Methods: A total of 44 eyes were enrolled. All subjects underwent macular thickness measurement using the Cirrus SD-OCT ma...
متن کاملRetinal Ganglion Cell Complex in Alzheimer Disease: Comparing Ganglion Cell Complex and Central Macular Thickness in Alzheimer Disease and Healthy Subjects Using Spectral Domain-Optical Coherence Tomography
Introduction: Alzheimer disease (AD) is the most common form of dementia worldwide. The modalities to diagnose AD are generally expensive and limited. Both the central nervous system (CNS) and the retina are derived from the cranial neural crest; therefore, changes in retinal layers may reflect changes in the CNS tissue. Optical coherence tomography (OCT) machine can show delicate retinal layer...
متن کاملOPTICAL PROPERTIES OF THIN Cu FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE
Copper films (250 nm) deposited on glass substrates, at different substrate temperatures. Their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. Kramers Kronig method was used for the analysis of the reflectivity curves of Cu films to obtain the optical constants of the films, while ellipsometery measu...
متن کاملSpectroscopic spectral-domain optical coherence microscopy.
The spectroscopic content within optical coherence tomography (OCT) data can provide a wealth of information. Spectroscopic OCT methods are frequently limited by time-frequency trade-offs that limit high spectral and spatial resolution simultaneously. We present spectroscopic spectral-domain optical coherence microscopy performed with a multimodality microscope. Restricting the spatial extent o...
متن کاملPrecise Measurement of Thickness Distribution of Non- Uniform Thin Films by Imaging Spectroscopic Reflectometry
− A new method of imaging spectroscopic photometry enabling us to perform the complete optical characterization of thin films exhibiting area non-uniformity in optical parameters is presented. An original imaging spectroscopic photometer operating in the reflection mode at normal incidence is used to apply this method. A CCD camera serves as a detector in this photometer. Therefore the spectral...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Optics express
دوره 22 5 شماره
صفحات -
تاریخ انتشار 2014